Critical-current measurements in planar Josephson junctions

Applied Physics Letters

Volumn 71, Issue 20, 1997, Pages 3010-3012

  Rzchowski, M S ^a   Hinaus, B M ^a  

^a Wisconsin Electric Machines and Power Electronics Consortium   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; CRITICAL CURRENT DENSITY (SUPERCONDUCTIVITY); CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC CURRENT MEASUREMENT; ELECTRIC RESISTANCE; ELECTRODES; HIGH TEMPERATURE SUPERCONDUCTORS; JOSEPHSON JUNCTION DEVICES; MAGNETIC FIELDS; MATHEMATICAL MODELS;

BIAS CURRENT DISTRIBUTION; MEISSNER FIELD;

CRITICAL CURRENTS;

EID: 0031260809     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.120246     Document Type: Article

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