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Volumn 33, Issue 10, 1997, Pages 1794-1800

Transverse mode characteristics of vertical-cavity surface-emitting lasers buried in amorphous GaAs antiguide layer

Author keywords

Amorphous semiconductor materials; Finite difference methods; Laser modes; Semiconductor lasers; Surface emitting lasers

Indexed keywords

AMORPHOUS MATERIALS; ELECTRIC CURRENTS; FINITE DIFFERENCE METHOD; LIGHT EMISSION; LIGHT PROPAGATION; REFRACTIVE INDEX; SEMICONDUCTING GALLIUM ARSENIDE; SEMICONDUCTOR LASERS;

EID: 0031258025     PISSN: 00189197     EISSN: None     Source Type: Journal    
DOI: 10.1109/3.631285     Document Type: Article
Times cited : (20)

References (19)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.