The morphology of CdTe deposited by organometallic vapor phase epitaxy: The effect of substrate misorientation

Journal of Electronic Materials

Volumn 26, Issue 10, 1997, Pages 1261-1264

  Yong, K ^a   Sides, P J ^a   Gellman, A J ^a  

^a CARNEGIE MELLON UNIVERSITY   (United States)

Author keywords

Cadmium telluride; Facets; Morphology; Organometallic vapor phase epitaxy (OMVPE)

Indexed keywords

CRYSTAL ORIENTATION; DEPOSITION; FILM GROWTH; METALLORGANIC VAPOR PHASE EPITAXY; MORPHOLOGY; SEMICONDUCTING CADMIUM COMPOUNDS; SINGLE CRYSTALS; SUBSTRATES; SURFACE STRUCTURE; THERMAL EFFECTS; TRANSMISSION ELECTRON MICROSCOPY;

CADMIUM TELLURIDE; SCHOWOEBEL BARRIERS;

SEMICONDUCTING FILMS;

EID: 0031257370     PISSN: 03615235     EISSN: None     Source Type: Journal    
DOI: 10.1007/s11664-997-0030-y     Document Type: Article

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