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Volumn 32, Issue 10, 1997, Pages 1604-1609

A 0.5-V MTCMOS/SIMOX logic gate

Author keywords

CMOS digital integrated circuits; CMOSFET logic devices; Low voltage circuits; Power control; Silicon oninsulator technology

Indexed keywords

DIGITAL INTEGRATED CIRCUITS; LEAKAGE CURRENTS; LOGIC DEVICES; LOGIC GATES; MOSFET DEVICES; SILICON ON INSULATOR TECHNOLOGY;

EID: 0031256946     PISSN: 00189200     EISSN: None     Source Type: Journal    
DOI: 10.1109/4.634672     Document Type: Article
Times cited : (17)

References (10)
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    • (1995) ISSCC Dig. Tech. Papers , pp. 84-85
    • Seta, K.1    Hara, H.2    Kuroda, T.3    Kakumu, M.4    Sakurai, T.5
  • 4
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    • A 1 V multi-threshold voltage CMOS DSP with an efficient power management technique for mobile phone application
    • S. Mutoh, S. Shigematsu, Y. Matsuya, H. Fukuda, and J. Yamada, "A 1 V multi-threshold voltage CMOS DSP with an efficient power management technique for mobile phone application," in ISSCC Dig. Tech. Papers, 1996, pp. 168-169.
    • (1996) ISSCC Dig. Tech. Papers , pp. 168-169
    • Mutoh, S.1    Shigematsu, S.2    Matsuya, Y.3    Fukuda, H.4    Yamada, J.5
  • 5
    • 0028134534 scopus 로고
    • A 200 mV self-testing encoder/decoder using Stanford ultra-low-power CMOS
    • J. B. Burr and J. Shott, "A 200 mV self-testing encoder/decoder using Stanford ultra-low-power CMOS," in ISSCC Dig. Tech. Papers, 1994, pp. 84-85.
    • (1994) ISSCC Dig. Tech. Papers , pp. 84-85
    • Burr, J.B.1    Shott, J.2
  • 8
    • 0017998279 scopus 로고
    • 2 layers formed by oxygen implantation into silicon
    • Aug.
    • 2 layers formed by oxygen implantation into silicon," Electron. Lett., vol. 14, no. 18, pp. 593-594, Aug. 1978.
    • (1978) Electron. Lett. , vol.14 , Issue.18 , pp. 593-594
    • Izumi, K.1    Doken, M.2    Ariyoshi, H.3
  • 9
    • 0028745562 scopus 로고
    • A dynamic threshold voltage MOSFET (DTMOS) for ultra-low voltage operation
    • F. Assaderaghi, D. Sinitsky, S. Parke, J. Bokor, P. K. Ko, and C. Hu, "A dynamic threshold voltage MOSFET (DTMOS) for ultra-low voltage operation," in IEDM Tech. Dig., 1994, pp. 809-812.
    • (1994) IEDM Tech. Dig. , pp. 809-812
    • Assaderaghi, F.1    Sinitsky, D.2    Parke, S.3    Bokor, J.4    Ko, P.K.5    Hu, C.6
  • 10
    • 0029712745 scopus 로고    scopus 로고
    • Suppression of threshold voltage variation in MTCMOS/SIMOX circuit operating below 0.5 V
    • M. Harada, T. Douseki, and T. Tsuchiya, "Suppression of threshold voltage variation in MTCMOS/SIMOX circuit operating below 0.5 V," in Proc. 1996 IEEE Symp. VLSI Technology, pp. 96-97.
    • Proc. 1996 IEEE Symp. VLSI Technology , pp. 96-97
    • Harada, M.1    Douseki, T.2    Tsuchiya, T.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.