Nanowire bonding with the scanning tunneling microscope

Surface Science

Volumn 386, Issue 1-3, 1997, Pages 279-289

  Van Haesendonck, C ^a   Stockman, L ^a,b   Vullers, R J M ^a   Bruynseraede, Y ^a   Langer, L ^c   Bayot, V ^c   Grivei, E ^c   Issi, J P ^c   Heremans, J P ^d   Oik, C H ^d  

^a UNIVERSITY OF LEUVEN   (Belgium)

^b RADBOUD UNIVERSITY NIJMEGEN   (Netherlands)

^c UNIVERSITÉ CATHOLIQUE DE LOUVAIN   (Belgium)

^d GENERAL MOTORS CORPORATION   (United States)

Author keywords

Atomic force microscopy; Electrical transport (conductivity, resistivity, mobility, etc.); Electrical transport measurements; Fullerenes; Metallic films; Polycrystalline thin films; Quantum effects; Scanning tunneling microscopy

Indexed keywords

ELECTRIC CONDUCTIVITY OF SOLIDS; FULLERENES; GOLD; LITHOGRAPHY; NANOSTRUCTURED MATERIALS; NEGATIVE RESISTANCE; POLYCRYSTALLINE MATERIALS; SCANNING TUNNELING MICROSCOPY; THIN FILMS;

NANOTUBES; NANOWIRE BONDING;

METALLIC FILMS;

EID: 0031250032     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(97)00307-5     Document Type: Article

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