Ellipsometric studies of thermally induced transformation phenomena in oxide films

Thin Solid Films

Volumn 308-309, Issue 1-4, 1997, Pages 42-49

  Rose, Aimee ^a   Exarhos, Gregory J ^a  

^a PACIFIC NORTHWEST NATIONAL LABORATORY   (United States)

Author keywords

Ellipsometry; Phase transformation; Raman spectroscopy; Zinc oxide

Indexed keywords

AMORPHOUS FILMS; ANNEALING; CRYSTAL ORIENTATION; DEPOSITION; DIELECTRIC PROPERTIES; HIGH TEMPERATURE EFFECTS; HIGH TEMPERATURE OPERATIONS; INTERFACES (MATERIALS); PHASE TRANSITIONS; RAMAN SPECTROSCOPY; SUBSTRATES; THIN FILMS;

THERMALLY INDUCED TRANSFORMATION; ZINC OXIDE FILMS;

OPTICAL FILMS;

EID: 0031247650     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(97)00534-8     Document Type: Article

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