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Volumn 9, Issue 3, 1997, Pages 18-22

Causes of voiding in plastic ball grid array eutectic solder joints

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRONICS PACKAGING; EUTECTICS; MICROPROCESSOR CHIPS; RELIABILITY; SOLDERING ALLOYS;

EID: 0031247533     PISSN: 09540911     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (3)

References (10)
  • 1
    • 0343966730 scopus 로고    scopus 로고
    • The effects of solder joint voiding on pkastac bull grid array reliability
    • San Jose. CA. 10-12 Sepnember
    • Backs, D.R., et al., "The effects of solder joint voiding on pkastac bull grid array reliability". Proceedings of the Surface Mount International Technical Program. San Jose. CA. 10-12 Sepnember. 1996. pp. 121-6.
    • (1996) Proceedings of the Surface Mount International Technical Program , pp. 121-126
    • Backs, D.R.1
  • 2
    • 0029770607 scopus 로고    scopus 로고
    • How voids develop in BGA solder joints
    • January
    • O'Hara, W.B. and Lee, N.C., "How voids develop in BGA solder joints". Surface Mount Technology. January 1996. pp. 44-7.
    • (1996) Surface Mount Technology , pp. 44-47
    • O'Hara, W.B.1    Lee, N.C.2
  • 5
    • 7444238282 scopus 로고
    • Formation and corrol of vording in SMT
    • O'Hara, W.B. and Lee, N.C., "Formation and corrol of vording in SMT". Proceeding of ISHM. 1992. pp. 535-42.
    • (1992) Proceeding of ISHM , pp. 535-542
    • O'Hara, W.B.1    Lee, N.C.2
  • 6
    • 0021650093 scopus 로고
    • Adcances in solder pablic technology to eliminate voids
    • Roos-Kazel, B., "Adcances in solder pablic technology to eliminate voids". Proceedings of Curcuit Expo. 1984. pp. 49-53.
    • (1984) Proceedings of Curcuit Expo , pp. 49-53
    • Roos-Kazel, B.1
  • 7
    • 7444270735 scopus 로고    scopus 로고
    • DOE - Key to optimizing procees quality
    • February
    • Amockhneh. P. and Liu, S.T., "DOE - key to optimizing procees quality". Surface Mount Technology. February 1996. pp. 110-12.
    • (1996) Surface Mount Technology , pp. 110-112
    • Amockhneh, P.1    Liu, S.T.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.