Annealing effects for structural defects of silicon nitride ceramics

Journal of the Ceramic Society of Japan

Volumn 105, Issue 10, 1997, Pages 858-861

  Munakata, Fumio ^b   Sato, Chikai ^a   Hirosaki, Naoto ^b   Tanimura, Makoto ^a   Akimune, Yoshio ^b   Okamoto, Yusuke ^b   Inoue, Yasuhide ^b  

^a NISSAN ARC LTD   (Japan)

^b NISSAN MOTOR CO   (Japan)

Author keywords

Dislocation; Structural defect; TEM; type structure; Si3N4

Indexed keywords

ANNEALING; CRYSTAL DEFECTS; DISLOCATIONS (CRYSTALS); GRAIN SIZE AND SHAPE; SILICON NITRIDE; TRANSMISSION ELECTRON MICROSCOPY;

ANNEALING EFFECTS; STRUCTURAL DEFECTS;

CERAMIC MATERIALS;

EID: 0031245187     PISSN: 09145400     EISSN: None     Source Type: Journal    
DOI: 10.2109/jcersj.105.858     Document Type: Article

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