Temperature dependence of the InP(001) bulk and surface dielectric function

Applied Physics A: Materials Science and Processing

Volumn 65, Issue 3, 1997, Pages 333-339

  Zorn, M ^a   Trepk, T ^a   Zettler, J T ^a   Junno, B ^b   Meyne, C ^a   Knorr, K ^a   Wethkamp, T ^a   Klein, M ^a   Miller, M ^b   Richter, W ^a   Samuelson, L ^b  

^a TECHNISCHE UNIVERSITÄT BERLIN   (Germany)

^b LUND UNIVERSITY   (Sweden)

Author keywords

[No Author keywords available]

Indexed keywords

ANISOTROPY; CHEMICAL BEAM EPITAXY; DIELECTRIC PROPERTIES OF SOLIDS; ELLIPSOMETRY; INTERPOLATION; METALLORGANIC VAPOR PHASE EPITAXY; REFLECTION HIGH ENERGY ELECTRON DIFFRACTION; SPECTROMETERS; SURFACE PROPERTIES; SURFACE STRUCTURE; THERMAL EFFECTS;

BULK DIELECTRIC FUNCTION; SURFACE DIELECTRIC FUNCTION;

SEMICONDUCTING INDIUM PHOSPHIDE;

EID: 0031237838     PISSN: 09478396     EISSN: None     Source Type: Journal    
DOI: 10.1007/s003390050588     Document Type: Article

References (41)

1. N. Otsuka, M. Kito, Y. Mon, M. Ishino, Y. Matsui: J. Cryst. Growth 145, 866 (1994)
2. D.I. Babic, K. Streubel, R.P. Mirin, N.M. Margalit, J.E. Bowers, E.L. Hu, D.E. Mars, L. Yang, K. Carey: IEEE Phot. Technol. Lett. 7, 1025 (1995)
3. L. Nguyen, L. Larson, U. Mishara: Proc. IEEE 80, 494 (1992)
4. D.F. Aspnes: Mater. Sci. Engng. B 30, 109 (1995)
5. J.-T. Zettler: Progress in Crystal Growth and Characterisation of Materials, in press
6. R.M.A. Azzam, N.M. Bashara: Ellipsometry and Polarized Light (North-Holland, Amsterdam 1977)
7. C.H. Kuo, S. Anand, H. Fathollahnejad, R. Ramamurti, R. Droopad, G.N. Maracas: J. Vac. Sci. Technol. B 13, 681 (1995)
8. M. Zorn, T. Trepk, M. Klein, J.-T. Zettler, W. Richter: In Proc. 7th European Workshop on MOVPE and Related Growth Techniques, Berlin, Germany, 1997, G-7
9. D.E. Aspnes, W.E. Quinn, M.C. Tamargo, M.A.A. Pudensi, S.A. Schwarz, M.J.S.P. Brasil, R.E. Nahory, S. Gregory: Appl. Phys. Lett. 80, 1244 (1992)
10. M. Zorn, J. Jönsson, W. Richter, J.-T. Zettler, K. Ploska: Phys. Stat. Sol. (a) 152, 23 (1995)
11. D.E. Aspnes: J. Vac. Sci. Technol. B 3, 1498 (1985)
12. D.E. Aspnes, A.A. Studna: Phys. Rev. B 27, 985 (1983)
13. P. Lautenschlager, M. Garriga, M. Cardona: Phys. Rev. B 36, 4813 (1987)
14. Z. Hang, H. Shen, F.H. Pollak: Solid State Comm. 73, 15 (1990)
15. M. Zorn, T. Trepk, J.-T. Zettler, C. Meyne, K. Knorr, Th. Wethkamp, W. Richter, B. Junno, M. Miller, L Samuelson: In Proceedings of the 8th Int. Conf. on InP & Rel. Mat., Schwäbisch-Gmünd, Germany, 1996, WP-C32, IEEE Catalog #96CH35930
16. J.S. Luo, J.F. Geisz, J.M. Olson: J. Cryst. Growth, in print
17. K.B. Ozanyan, P.]. Parbrook, M. Hopkinson, C.R. Whitehouse, Z. Sobiesierski, D.l. Westwood: J. Appl. Phys. 82, 477 (1997)
18. D.E. Aspnes, A.A. Studna: J. Vac. Sci. Technol. A 5, 546 (1987)
19. N. Esser, R. Hunger, J. Rumberg, W. Richter, R. Del Sole, A.I. Shkrebtii: Surf. Sci. 307-309, 1045 (1994)
20. I. Kamiya, D.E. Aspnes, H. Tanaka, L.T. Florez, J.R Harbison, R.H. Bhat: Phys. Rev. Lett. 68, 627 (1992)
21. I. Kamiya, D.E. Aspnes, L.T. Florez, J.R Harbison: Phys. Rev. B 46, 15894 (1992)
22. J.-T. Zettler, T. Wethkamp, M. Zorn, M. Pristovsek, C. Meyne, K. Ploska, W. Richter: Appl. Phys. Lett. 67, 3783 (1995)
23. A.A. Studna, D.E. Aspnes, L.T. Florez, B.J. Wilkens, J.R Harbison: J. Vac. Sci. Technol. A 7, 885 (1989)
24. D.E. Aspnes: J. Opt. Soc. Am. 63, 1380 (1973)
25. P. Snyder, J. Woolam, S. Alterovitz, and B. Johs: J. Appl. Phys. 68, 5925 (1990)
26. M. Erman, J. Theeten, P. Chambon, S. Kelso, D.E. Aspnes: J. Appl. Phys. 56, 2664 (1984)
27. H. Yoa, P. Snyder, J. Woolam: J. Appl. Phys. 70, 3261 (1991)
28. C.H. Kuo, S. Anand, R. Droopad, K.Y. Choi, G.N. Maracas: J. Vac. Sci. Technol. B 12, 1214 (1994)
29. M. Cardona: Modulation Spectroscopy (Academic Press, New York 1969)
30. D.E. Aspnes: In Handbook on Semiconductors, ed. by M. Balkanski (North-Holland, Amsterdam 1980) p. 109
31. C. Kim, I. Garland, H. Abad, P. Raccah: Phys. Rev. B 45, 11749 (1992)
32. C. Kim, J. Garland, P. Raccah: Phys. Rev. B 47, 1876 (1993)
33. J.-T. Zettler, T. Trepk, L. Spanos, Y.-Z. Hu, W. Richter: Thin Solid Films 233, 402 (1993)
34. Z. Hang, H. Shen, F. Pollak: Solid State Communications 73, 15 (1990)
35. D.W. Kisker, G.B. Stephenson, I. Kamiya, P.H. Fuoss, D.E. Aspnes, L. Mantese, S. Brennan: Phys. Stat. Sol (a) 152, 9 (1995)
36. N. Esser, U. Resch-Esser, M. Pristovsek, W. Richter: Phys. Rev. B 53, R13257 (1996)
37. X. Hou, G. Dong, X. Ding, X. Wang: J. Phys. C 20, L121 (1987)
38. J. Woll, Th. Allinger, V. Polyakov, J.A. Schaefer, A. Goldmann, W. Erfurth: Surf. Sci. 315, 293 (1994)
39. M.M. Sung, C. Kim, H. Bu, D.S. Karpuzov, J.W. Rabalais: Surf. Sci. 322, 116 (1995)
40. M. Shimomura, N. Sanada, Y. Fukuda, P.J. Moller: Surf. Sci. 359, L451 (1996)
41. P. Kurpas, J. Jönsson, W. Richter, D. Gutsche, M. Pristovsek, M. Zorn: J. Cryst. Growth. 145, 36 (1994)