XPS studies of oxide growth and segregation in aluminium-silicon alloys

Surface and Interface Analysis

Volumn 25, Issue 10, 1997, Pages 809-816

  Werrett, C R ^a   Pyke, D R ^a   Bhattacharya, A K ^a  

^a UNIVERSITY OF WARWICK   (United Kingdom)

Author keywords

Al Si alloy; Oxide growth; Segregation; XPS

Indexed keywords

ALUMINUM ALLOYS; MAGNESIUM; OXIDATION; SEGREGATION (METALLOGRAPHY); SODIUM; SURFACES; THERMAL EFFECTS;

OXIDE GROWTH;

X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 0031234929     PISSN: 01422421     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1096-9918(199709)25:10<809::AID-SIA304>3.0.CO;2-M     Document Type: Article

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