Soft X-ray spectromicroscopy

Journal of Electron Spectroscopy and Related Phenomena

Volumn 80, Issue , 1996, Pages 329-335

  Voss, J ^a   Fornefett, M ^a   Kunz, C ^a   Moewes, A ^a   Pretorius, M ^a   Ranck, A ^a   Schroeder, M ^a   Wedemeier, V ^a  

^a UNIVERSITY OF HAMBURG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CERAMIC MATERIALS; CRYSTALS; FLUORESCENCE; IMAGING SYSTEMS; IONS; LUMINESCENCE; OPTICS; PHOTOELECTRON SPECTROSCOPY; PHOTONS; POROUS SILICON; X RAY MICROSCOPES;

PHOTODESORBED IONS; PHOTOELECTRONS; X RAY SPECTROMICROSCOPY;

X RAY SPECTROSCOPY;

EID: 0030143126     PISSN: 03682048     EISSN: None     Source Type: Journal    
DOI: 10.1016/0368-2048(96)02986-6     Document Type: Article

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