The effect of indium impurity on the DC-etching behaviour of aluminum foil for electrolytic capacitor usage

Corrosion Science

Volumn 39, Issue 9, 1997, Pages 1531-1543

  Lin, W ^a   Tu, G ^a   Lin, C F ^b   Peng, Y M ^b  

^a NATIONAL CHIAO TUNG UNIVERSITY   (Taiwan)

^b INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE   (Taiwan)

Author keywords

A. aluminium; B. SEM; B. SIMS; C. pitting corrosion

Indexed keywords

ACTIVATION ENERGY; ALUMINUM FOIL; COMPOSITION EFFECTS; ELECTROLYTIC CAPACITORS; IMPURITIES; INDIUM; PITTING; SCANNING ELECTRON MICROSCOPY; SECONDARY ION MASS SPECTROMETRY; SURFACE TREATMENT;

IMMERSION REDUCTION REACTION; ROLLING LINE EFFECT; SURFACE ETCHING; TUNNEL ETCHING;

ETCHING;

ALUMINUM; PITTING CORROSION;

EID: 0031231409     PISSN: 0010938X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0010-938X(97)00052-8     Document Type: Article

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