Statistical models for charge collection efficiency and variance in semiconductor spectrometers

Journal of Applied Physics

Volumn 82, Issue 6, 1997, Pages 2754-2758

  Ruzin, A ^a   Nemirovsky, Y ^a  

^a TECHNION ISRAEL INSTITUTE OF TECHNOLOGY   (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON ABSORPTION; FUNCTIONS; MATHEMATICAL MODELS; PHOTONS; SCHOTTKY BARRIER DIODES; SEMICONDUCTING CADMIUM COMPOUNDS; SPECTROMETERS; STATISTICAL METHODS;

ATOMIC NUMBER; BIAS VOLTAGE; CHARGE COLLECTION EFFICIENCY; PHOTON ENERGY; RAMO THEOREM; SEMICONDUCTOR SPECTROMETERS;

CHARGE CARRIERS;

EID: 0031224588     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.366106     Document Type: Article

References (11)

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