Effects of Surface/Interface Morphology on Giant Magnetoresistance and Magnetic Field Sensitivity of NiO-Based Spin-Valves

IEEE Transactions on Magnetics

Volumn 33, Issue 5 PART 2, 1997, Pages 3550-3552

  Han, De Hua ^a  

^a UNIVERSITY OF MINNESOTA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COBALT; COPPER; INTERFACES (MATERIALS); MAGNETORESISTANCE; MORPHOLOGY; MULTILAYERS; NICKEL COMPOUNDS; SILICON; SURFACE ROUGHNESS;

MAGNETIC FIELD SENSITIVITY (MFS); SPIN VALVE FILMS;

MAGNETIC FILMS;

EID: 0031220619     PISSN: 00189464     EISSN: None     Source Type: Journal    
DOI: 10.1109/20.619494     Document Type: Article

References (8)

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8. E. Egelhoff, T. Ha, R. D. K. Misra, K. Kadmon, J. Nir, C. J. Powell, M. D. Stiles, R. D. McMichael, C. L. Lin, J. M. Sivertsen, J. H. Judy, K. Takano, A. E. Berkowitz, T. C. Anthony, and J. A. Brug, Magnetoresistance values exceeding 21 % in symmetric spin valves, J. Appl. Phys., vol. 78, pp. 273-277, 1995.