Enhanced local surface conductivity measurements by scanning tunneling microscopy

Review of Scientific Instruments

Volumn 68, Issue 8, 1997, Pages 3104-3107

  Muller F ^a   Muller A D ^a   Meissner, O ^a   Heilmann, A ^a   Hietschold, M ^a  

^a CHEMNITZ UNIVERSITY OF TECHNOLOGY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

COMPOSITE MATERIALS; COMPUTER SOFTWARE; DIGITAL CONTROL SYSTEMS; ELECTRIC CONDUCTIVITY MEASUREMENT; ELECTRIC CURRENTS; GOLD; IMAGING TECHNIQUES; MATHEMATICAL TECHNIQUES; METALLIC FILMS; SILICON WAFERS; SURFACE PROPERTIES; SURFACES;

LOCAL REACTANCE; LOCAL SURFACE CONDUCTIVITY; PLASMA POLYMER GOLD COMPOSITE; SURFACE TOPOGRAPHY;

SCANNING TUNNELING MICROSCOPY;

EID: 0031212489     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1148250     Document Type: Article

References (13)

1. R. Wiesendanger and H.-J. Güntheroth, Scanning Tunneling Microscopy II, Springer Series in Surface Science (Springer, Berlin, 1992), Vol. 28.
2. A. Mandelis, Rev. Sci. Instrum. 65, 3309 (1994).
3. J. Colchero, M. Luna, and A. M. Baro, Appl. Phys. Lett. 68, 2896 (1996).
4. P.-A. Probst and A. Jaquier, Rev. Sci. Instrum. 65, 747 (1994).
5. R. Garcia, C. Garnica, and M. A. H. Garnica, J. Vac. Sci. Technol. B 9, 670 (1991).
6. H. Yamada, T. Sumomogi, and T. Endo, J. Vac. Sci. Technol. B 12, 1655 (1994).
7. R. Guckenburger, T. Hartmann, W. Wiegräbe, and W. Baumeister, in Scanning Tunneling Microscopy II, edited by H.-J. Guntherroth and R. Wiesendanger, Springer Series in Surface Science (Springer, Berlin, 1995), Vol. 28.
8. Hamann and M. Hietschold, Raster-Tunnel-Mikroskopie (Akademie, Berlin, 1991), p. 98.
9. T. M. H. Wong and M. E. Weiland, Meas. Sci. Technol. 4, 270 (1993).
10. R. S. Robinson, T. H. Kimsey, and R. Kimsey, J. Vac. Sci. Technol. B 9, 631 (1991).
11. F. Müller, A.-D. Müller, and M. Hietschold, in STM-Related Spectroscopies of Semiconductor Interfaces, edited by M. Prietsch (Bad Honnef, 1995).
12. A. Heilmann and C. Hamann, Prog. Colloid Polym. Sci. 85, 102 (1991).
13. H. Strecker, C. Stahl, and H. Starke, J. Vac. Sci. Technol. A 8, 618 (1991).