Scanning tunneling microscopy modification of Ag thin films on Si(100): Local rearrangement of the Si substrate by Ag/Si eutectic phase formation

Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Volumn 15, Issue 4, 1997, Pages 1364-1368

  Memmert, U ^a   Hodel, U ^a   Hartmann, U ^a,b  

^a FORSCHUNGSZENTRUM JÜLICH   (Germany)

^b SAARLAND UNIVERSITY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL MICROSTRUCTURE; CURRENT VOLTAGE CHARACTERISTICS; EUTECTICS; LOW ENERGY ELECTRON DIFFRACTION; MORPHOLOGY; OHMIC CONTACTS; POLYCRYSTALLINE MATERIALS; SEMICONDUCTING SILICON; SILVER; SUBSTRATES; THIN FILMS;

FEEDBACK ELECTRONICS; STRANSKI-KRASTANOV MODE; TUNNEL CURRENT PREAMPLIFIER; VOLLMER-WEBER MODE;

SCANNING TUNNELING MICROSCOPY;

EID: 0031189376     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.589539     Document Type: Article

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