Correlation between composition, microstructure, and ferroelectric properties of SrBi2Ta2O9 thin films

Journal of the Electrochemical Society

Volumn 144, Issue 7, 1997, Pages

  Ono, Sachiko ^a,d   Sakakibara, Akira ^a   Seki, Tomonori ^a   Osaka, Tetsuya ^a,d   Koiwa, Ichiro ^b   Mita, Juro ^b   Iwabuchi, Toshiyuki ^b   Asami, Katsuhiko ^c  

^a WASEDA UNIVERSITY   (Japan)

^b OKI ELECTRIC INDUSTRY CO   (Japan)

^c TOHOKU UNIVERSITY   (Japan)

^d ELECTROCHEMICAL SOCIETY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; CRYSTAL MICROSTRUCTURE; DEPOSITION; FERROELECTRIC MATERIALS; GRAIN BOUNDARIES; HYSTERESIS; LEAKAGE CURRENTS; MORPHOLOGY; STRONTIUM COMPOUNDS; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY; X RAY PHOTOELECTRON SPECTROSCOPY;

SOLUTION DEPOSITION;

DIELECTRIC FILMS;

EID: 0031186971     PISSN: 00134651     EISSN: None     Source Type: Journal    
DOI: 10.1149/1.1837793     Document Type: Article

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