High resolution electron microscopic studies of the atomistic glide processes in semiconductors

Journal de Physique III

Volumn 7, Issue 7, 1997, Pages 1451-1467

  Maeda, K ^a   Inoue, M ^a   Suzuki, K ^a   Amasuga, H ^a   Nakamura, M ^a   Kanematsu, E ^a  

^a UNIVERSITY OF TOKYO   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL LATTICES; ELECTRON BEAMS; ELECTRON MICROSCOPY; SEMICONDUCTING GALLIUM ARSENIDE; SEMICONDUCTING GERMANIUM; STACKING FAULTS;

ATOMISTIC GLIDE PROCESS; KINK MIGRATION; KINK PAIR FORMATION;

DISLOCATIONS (CRYSTALS);

EID: 0031186905     PISSN: 11554320     EISSN: None     Source Type: Journal    
DOI: 10.1051/jp3:1997199     Document Type: Article

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