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Volumn 37, Issue 3, 1996, Pages 273-278

Image simulation of partial dislocation lines plan-viewed by high resolution electron microscopy

Author keywords

Dangling bond; Forbidden spots; Gaas; Kink; Reconstruction; Stacking fault; Superlattice; Zincblende

Indexed keywords

ELECTRON BEAMS; ELECTRON MICROSCOPY; SEMICONDUCTING FILMS; SEMICONDUCTING GALLIUM ARSENIDE; SEMICONDUCTOR DEVICE MODELS; SEMICONDUCTOR DEVICE STRUCTURES; SEMICONDUCTOR SUPERLATTICES; STACKING FAULTS;

EID: 0030106193     PISSN: 09161821     EISSN: None     Source Type: Journal    
DOI: 10.2320/matertrans1989.37.273     Document Type: Article
Times cited : (2)

References (15)
  • 7
    • 0000541543 scopus 로고
    • H. Alexander: Dislocations in Solids vol. 7, ed. by F. R. N. Nabarro, North-Holland, Amsterdam (1986), p. 113.
    • (1986) Dislocations in Solids , vol.7 , pp. 113
    • Alexander, H.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.