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Volumn 82, Issue 2, 1997, Pages 635-638
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Layer structure analysis of Er δ-doped InP by x-ray crystal truncation rod scattering
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Author keywords
[No Author keywords available]
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Indexed keywords
COMPUTER SIMULATION;
CRYSTAL STRUCTURE;
ELECTROMAGNETIC WAVE SCATTERING;
ERBIUM;
HETEROJUNCTIONS;
METALLORGANIC VAPOR PHASE EPITAXY;
RUTHERFORD BACKSCATTERING SPECTROSCOPY;
SEMICONDUCTOR DEVICE STRUCTURES;
SEMICONDUCTOR DOPING;
SYNCHROTRON RADIATION;
X RAY ANALYSIS;
LAYER STRUCTURE ANALYSIS;
ROCKSALT STRUCTURE;
X RAY CRYSTAL TRUNCATION ROD SCATTERING;
X RAY INTERFERENCE;
SEMICONDUCTING INDIUM PHOSPHIDE;
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EID: 0031186209
PISSN: 00218979
EISSN: None
Source Type: Journal
DOI: 10.1063/1.365591 Document Type: Article |
Times cited : (9)
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References (13)
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