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Volumn 82, Issue 2, 1997, Pages 635-638

Layer structure analysis of Er δ-doped InP by x-ray crystal truncation rod scattering

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; CRYSTAL STRUCTURE; ELECTROMAGNETIC WAVE SCATTERING; ERBIUM; HETEROJUNCTIONS; METALLORGANIC VAPOR PHASE EPITAXY; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SEMICONDUCTOR DEVICE STRUCTURES; SEMICONDUCTOR DOPING; SYNCHROTRON RADIATION; X RAY ANALYSIS;

EID: 0031186209     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.365591     Document Type: Article
Times cited : (9)

References (13)
  • 13


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.