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Volumn 41, Issue 4-5, 1997, Pages 593-599
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The role of two-cycle simulation in the S/390 verification process
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Author keywords
[No Author keywords available]
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Indexed keywords
APPLICATION SPECIFIC INTEGRATED CIRCUITS;
BOOLEAN FUNCTIONS;
COMPUTER SIMULATION;
ERROR CORRECTION;
MICROPROCESSOR CHIPS;
PARALLEL PROCESSING SYSTEMS;
TIMING CIRCUITS;
ARRAY BUILT IN SELF TEST (ABIST);
LEVEL SENSITIVE SCAN DESIGN (LSSD) RINGS;
LOGIC BUILT IN SELF TEST (LBIST);
TWO CYCLE SIMULATION;
COMPUTER AIDED LOGIC DESIGN;
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EID: 0031176431
PISSN: 00188646
EISSN: None
Source Type: Journal
DOI: 10.1147/rd.414.0593 Document Type: Article |
Times cited : (6)
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References (2)
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