Series-system reliability-estimation using very small binomial samples

IEEE Transactions on Reliability

Volumn 46, Issue 2, 1997, Pages 296-302

  Willits, Craig J ^a   Dietz, Dennis C ^a   Moore, Albert H ^a  

^a Air Force Institute of Technology   (United States)

Author keywords

Bayes inference; Binomial test data; Confidence limit; Credibility limit; Lindstrom madden; Monte carlo; Series system reliability

Indexed keywords

COMPUTER SIMULATION; ESTIMATION; INFERENCE ENGINES; MONTE CARLO METHODS;

BAYES INFERENCE; BINOMIAL TEST DATA; CONFIDENCE LIMIT; SERIES SYSTEM RELIABILITY;

RELIABILITY THEORY;

EID: 0031170713     PISSN: 00189529     EISSN: None     Source Type: Journal    
DOI: 10.1109/24.589960     Document Type: Article

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