Identification and modeling of microwave loss mechanisms in YBa2Cu3O7-X

IEEE Transactions on Applied Superconductivity

Volumn 7, Issue 2 PART 2, 1997, Pages 1299-1302

  Herd, Jeffrey S ^a   Oates, Daniel E ^b   Halbritter, Jürgen ^c  

^a AIR FORCE RESEARCH LABORATORY   (United States)

^b MIT LINCOLN LABORATORY   (United States)

^c KARLSRUHE INSTITUTE OF TECHNOLOGY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE; CRITICAL CURRENT DENSITY (SUPERCONDUCTIVITY); ELECTRIC RESISTANCE; GRAIN BOUNDARIES; MAGNETIC HYSTERESIS; MATHEMATICAL MODELS; MICROWAVES; RESONATORS; STRIP TELECOMMUNICATION LINES; SUPERCONDUCTING FILMS; SURFACE PROPERTIES;

FLUX FLOW LOSSES; JOSEPHSON CURRENTS; MEISSNER STATE; SURFACE REACTANCE; SURFACE RESISTANCE;

OXIDE SUPERCONDUCTORS;

EID: 0031168699     PISSN: 10518223     EISSN: None     Source Type: Journal    
DOI: 10.1109/77.620761     Document Type: Article

References (7)

1. J. Halbritter, RF residual losses, surface impedance, and granularity in superconducting cuprates, J. Appl. Phys. 68, 6315, 1990.
2. M. A. Golosovsky, H. J. Snortland, and M. R. Beasley, Nonlinear microwave properties of superconducting Nb microstrip resonators, Phys. Rev. B 51, 6462, 1995.
3. D. E. Oates, P. P. Nguyen, G. Dresselhaus, C. W. Lam, and S. M. Ali, Measurements and modeling of linear and nonlinear effects in striplines, J. Supercond. 5, 361, 1992.
4. C superconducting thin films, Appl. Phys. Letters 53 (14), 1343, 1988.
5. C. Attanasio, L. Mariato, and R. Vaglio, Residual surface resistance of polycrystalline superconductors, Phys. Rev. B 43, 6128, 1991.
6. 7-x thin films; Measurements and a coupled grain model, Phys. Rev. B 48 (9), 6400, 1993.
7. 7-x thin film Josephson edge junctions, Appl. Physics Letters 68 (5), 705, 1996.