Measurements and calculations of flat and spherically bent mica crystals' reflectivity and using them for different applications in the spectral range 1/19 Å

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 2515, Issue , 1995, Pages 468-486

  Pikuz, Tatiana A ^a   Faenov, Anatoly Y ^a   Foerster, Eckhart ^b   Wolf, Johannes ^b   Wehrhan, O ^b   Heinisch, Josef ^b   Hoelzer, G ^b   Vollbrecht, Marcus ^b   Pikuz, Sergey A ^c   Romanova, Vera M ^c   Shelkovenko, Tatyana A ^c  

^a Multicharged Ions Spectra Data Center of VNIIFTRI   (Russian Federation)

^b FRIEDRICH SCHILLER UNIVERSITY JENA   (Germany)

^c LEBEDEV PHYSICAL INSTITUTE   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

REFLECTION; SILICATE MINERALS; SPECTROSCOPIC ANALYSIS; X RAY MICROSCOPES; X RAYS;

CRYSTAL PERFECTION; DISPERSION CHARACTERISTICS; HIGH-RESOLUTION SPECTROSCOPY; INTEGRAL REFLECTIVITY; MOSAIC CRYSTALS; REFLECTION CURVES; SPHERICAL CRYSTAL; TOPOGRAPHIC TECHNIQUES;

MICA;

EID: 85033188851     PISSN: 0277786X     EISSN: 1996756X     Source Type: Conference Proceeding    
DOI: 10.1117/12.212613     Document Type: Conference Paper

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