Ramp type HTS Josephson junctions with PrBaCuGaO barriers

IEEE Transactions on Applied Superconductivity

Volumn 5, Issue 2, 1995, Pages 2095-2098

  Verhoeven, Martin A J ^a   Gerritsma, Gerrit J ^a   Rogalla, Horst ^a   Golubov, Alexander A ^b  

^a UNIVERSITY OF TWENTE   (Netherlands)

^b INSTITUTE OF SOLID STATE PHYSICS   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

CRITICAL CURRENT DENSITY (SUPERCONDUCTIVITY); DYSPROSIUM COMPOUNDS; ELECTRIC RESISTANCE; ELECTRIC VARIABLES MEASUREMENT; ELECTRODES; FABRICATION; HIGH TEMPERATURE SUPERCONDUCTORS; MICROPROCESSOR CHIPS; OXIDE SUPERCONDUCTORS; PRASEODYMIUM COMPOUNDS; TEMPERATURE;

BARRIERS; FLUX TRAPPING; FRAUNHOFER PATTERN; RAMP TYPE JOSEPHSON JUNCTIONS;

JOSEPHSON JUNCTION DEVICES;

EID: 0029322372     PISSN: 10518223     EISSN: 15582515     Source Type: Journal    
DOI: 10.1109/77.402996     Document Type: Article

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