X-ray induced reduction effects at ceO2 surfaces: An x-ray photoelectron spectroscopy study

Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films

Volumn 9, Issue 3, 1991, Pages 1416-1420

  Paparazzo, E ^a   Ingo, G M ^b   Zacchett, N ^c  

^a CNR   (Italy)

^b Institute for Environmental Engineering and Geosciences (CNR)   (Italy)

^c Casella Postale 10747 ^*  (Lesotho)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 53049087763     PISSN: 07342101     EISSN: 15208559     Source Type: Journal    
DOI: 10.1116/1.577638     Document Type: Article

References (15)

1. P. Burroughs, A. Hamnett, A. F. Orchard, and G. Thornton, J. Chem. Soc. Dalton Trans. 1686 (1976).
2. T. L. Barr, in Quantitative Surface Analysis of Materials, edited by N. S. McIntyre (American Society for Testing Materials, Philadelphia, 1978), Special Technical Publication No. 643, p. 83.
3. G. Thornton, and M. J. Dempsey, Chem. Phys, Lett. 77, 409 (1981).
4. A. Fujimori, Phys. Rev. 27, 3992 (1983)
5. J. C. Allen, J. Magn. Magn. Mater. 47, 168 (1985).
6. Kotani, T. and J. C. Parbelas, Adv. Phys. 37, 37 (1988).
7. F. Le Normand, L. Hilaire, P. Legare, Solid State Commun. 71, 885 (1989).
8. C. A. Strydom, and H. J. Strydom, Inorg. Chim. Acta 161, 7 (1989).
9. E. Paparazzo, Surf. Sci. 234, 253 (1990).
10. M. Ingo, E. Paparazzo, O. Bagnarelli, and N. Zacehetti, Surf. Interface Anal. 16, 515 (1990).
11. D. A. Shirley, in Photocmission in Solids, edited by L. Ley and M. Cardona (Springer, Berlin, 1979), p. 165.
12. E. Paparazzo, J. Electron Spectrosc. Relat. Phenom. 43, 97 (1987).
13. G. Kaindl, G. K. Wertheim, G. Schmiester, and E. V. Sampathkumaran, Phys. Rev. Lett. 58, 606 (1987).
14. M. P. Seah and W. A. Dench. Surf Interface Anal. 1, 2 (1979).
15. S. Tanuma, C. J. Powell, and D. R. Penn. Surf Sci. 192, 849 (1987)