Numerical analysis of a PbTiO3 ferroelectric thin-film infrared optical diode

IEEE Transactions on Electron Devices

Volumn 44, Issue 6, 1997, Pages 937-942

  Chen, F Y ^a,b   Fang, Y K ^a   Shu, C Y ^a   Chen, J R ^a  

^a NATIONAL CHENG KUNG UNIVERSITY   (Taiwan)

^b NATIONAL TSING HUA UNIVERSITY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC CONDUCTIVITY OF SOLIDS; FERROELECTRIC DEVICES; NUMERICAL ANALYSIS; PERMITTIVITY MEASUREMENT; SEMICONDUCTING LEAD COMPOUNDS; SEMICONDUCTOR DEVICE MANUFACTURE; SEMICONDUCTOR JUNCTIONS; SPECIFIC HEAT OF SOLIDS; SPUTTER DEPOSITION; THIN FILM DEVICES; VOLTAGE MEASUREMENT;

THIN FILM INFRARED OPTICAL DIODES;

LIGHT EMITTING DIODES;

EID: 0031165490     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/16.585540     Document Type: Article

References (11)

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