Critical currents proximity effect and josephson penetration depth in planar high-Tc josephson junctions

IEEE Transactions on Applied Superconductivity

Volumn 7, Issue 2 PART 3, 1997, Pages 3208-3212

  Tolpygo, Sergey K ^a   Gurvitch, Michael ^a  

^a STONY BROOK UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CRITICAL CURRENT DENSITY (SUPERCONDUCTIVITY); CRITICAL CURRENTS; HIGH TEMPERATURE SUPERCONDUCTORS; IRRADIATION; MAGNETIC FIELD EFFECTS; SUPERCONDUCTING FILMS; THERMAL EFFECTS; YTTRIUM COMPOUNDS;

ELECTRON IRRADIATION; JOSEPHSON PENETRATION DEPTH; PROXIMITY EFFECT;

JOSEPHSON JUNCTION DEVICES;

EID: 0031164979     PISSN: 10518223     EISSN: None     Source Type: Journal    
DOI: 10.1109/77.622013     Document Type: Article

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