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Volumn 11, Issue 1, 1981, Pages 1-26
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Scanning transmission electron microscopy: Microanalysis for the microelectronic age
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0345345385
PISSN: 03054608
EISSN: None
Source Type: Journal
DOI: 10.1088/0305-4608/11/1/007 Document Type: Article |
Times cited : (44)
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References (56)
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