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Volumn 124, Issue 4, 1997, Pages 615-623
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Investigating chemical structure in a silicon CCD using extended X-Ray absorption fine structure
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Author keywords
Charge Coupled Device (CCD); Extended X ray Absorption Fine Structure (EXAFS); Quantum Efficiency (Q(E)); Structural chemistry
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Indexed keywords
CHARGE COUPLED DEVICES;
CHEMICAL BONDS;
FOURIER TRANSFORMS;
QUANTUM EFFICIENCY;
SILICA;
SILICON;
SYNCHROTRONS;
X RAY SPECTROSCOPY;
BOND LENGTH;
EXTENDED X RAY ABSORPTION FINE STRUCTURE;
INACTIVE LAYERS;
INTERATOMIC DISTANCES;
MOLECULAR STRUCTURE;
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EID: 0031142797
PISSN: 0168583X
EISSN: None
Source Type: Journal
DOI: 10.1016/S0168-583X(97)00115-8 Document Type: Article |
Times cited : (2)
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References (18)
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