메뉴 건너뛰기




Volumn 124, Issue 4, 1997, Pages 615-623

Investigating chemical structure in a silicon CCD using extended X-Ray absorption fine structure

Author keywords

Charge Coupled Device (CCD); Extended X ray Absorption Fine Structure (EXAFS); Quantum Efficiency (Q(E)); Structural chemistry

Indexed keywords

CHARGE COUPLED DEVICES; CHEMICAL BONDS; FOURIER TRANSFORMS; QUANTUM EFFICIENCY; SILICA; SILICON; SYNCHROTRONS; X RAY SPECTROSCOPY;

EID: 0031142797     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(97)00115-8     Document Type: Article
Times cited : (2)

References (18)
  • 8
    • 85033111536 scopus 로고    scopus 로고
    • private communication
    • P. Poole, EEV Ltd., private communication.
    • EEV Ltd.
    • Poole, P.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.