SCOPUS 정보 검색 플랫폼

Thin Solid Films

Volumn 300, Issue 1-2, 1997, Pages 11-17

Influence of substrate properties on the growth of titanium films: Part II

(2) Poppeller, M a Abermann, R a

a UNIVERSITY OF INNSBRUCK (Austria)

Author keywords

Growth mechanism; Heat treatment; Stress; Titanium

Indexed keywords

ANNEALING; COMPRESSIVE STRENGTH; DEPOSITION; DIFFUSION IN SOLIDS; EVAPORATION; FILM GROWTH; HYDROGEN; OXYGEN; STRESSES; SUBSTRATES; TENSILE PROPERTIES; TITANIUM;

GROWTH MECHANISMS; OXYGEN DOSING;

METALLIC FILMS;

EID: 0031141118 PISSN: 00406090 EISSN: None Source Type: Journal
DOI: 10.1016/S0040-6090(96)09525-9 Document Type: Article

Times cited : (4)

References (8)

1
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- (1997) Thin Solid Films , vol.295 , pp. 60
- Poppeller, M.¹ Abermann, R.²

2
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- (1990) Rev. Sci. Instrum. , vol.61 , pp. 3859
- Koch, R.¹ Leonhard, H.² Thurner, G.³ Abermann, R.⁴

3
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- R. Abermann, Thin Solid Films 186 (1990) 233.
- (1990) Thin Solid Films , vol.186 , pp. 233
- Abermann, R.¹

4
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- U. Diebold, J.M. Pan, Th.E. Madey, Surf. Sci. 845 (1995) 331-333.
- (1995) Surf. Sci. , vol.845 , pp. 331-333
- Diebold, U.¹ Pan, J.M.² Madey Th., E.³

5
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- Master's thesis, University of Innsbruck
- P. Oberhauser, Master's thesis, University of Innsbruck, 1996.
- (1996)
- Oberhauser, P.¹

6
- 0013300983
- P. Ehrlich, Z. Elektrochemie 45 (1939) 362.
- (1939) Z. Elektrochemie , vol.45 , pp. 362
- Ehrlich, P.¹

7
- 0004419330
- Swarthmore, PA
- Joint Committee on Powder Diffraction Data Standards, Powder Diffraction Data, Swarthmore, PA, 1990.
- (1990) Powder Diffraction Data

8
- 0027589597
- H.J. Schneeweiß, R. Abermann, Thin Solid Films 228 (1993) 40.
- (1993) Thin Solid Films , vol.228 , pp. 40
- Schneeweiß, H.J.¹ Abermann, R.²

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.