Fast parameter extraction of general interconnects using geometry independent measured equation of invariance

IEEE Transactions on Microwave Theory and Techniques

Volumn 45, Issue 5 PART 2, 1997, Pages 827-836

  Sun, Weikai ^a  

^a University of California Santa Cruz   (United States)

Author keywords

Capacitance matrix; Fast 3 D extraction; Geometry independent; Interconnects; Measured equation of invariance (MEI); Measuring loop

Indexed keywords

CALCULATIONS; CAPACITANCE; DIFFERENCE EQUATIONS; GEOMETRY; MATRIX ALGEBRA; MICROWAVES; NUMERICAL METHODS;

FAST 3-D EXTRACTION; MEASURED EQUATION OF INVARIANCE;

INTERCONNECTION NETWORKS;

EID: 0031140482     PISSN: 00189480     EISSN: None     Source Type: Journal    
DOI: 10.1109/22.575607     Document Type: Article

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