A Finite-Difference Procedure for the Exterior Problem Inherent in Capacitance Computations for VLSI Interconnections

IEEE Transactions on Electron Devices

Volumn 35, Issue 7, 1988, Pages 985-992

  Zemanian, A H ^a  

^a STONY BROOK UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

MATHEMATICAL TECHNIQUES - FINITE ELEMENT METHOD;

DIELECTRIC PERMITTIVITY; THIN HORIZONTAL STRIP; VLSI INTERCONNECTIONS;

INTEGRATED CIRCUITS, VLSI;

EID: 0024053310     PISSN: 00189383     EISSN: 15579646     Source Type: Journal    
DOI: 10.1109/16.3355     Document Type: Article

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