A scanning tunneling microscopy study of water on Si(111)-(7 × 7): Adsorption and oxide desorption

Surface Science

Volumn 380, Issue 2-3, 1997, Pages 408-416

  Self, K W ^b   Yan, C ^a,b   Weinberg, W H ^b  

^a APPLIED MATERIALS INC   (United States)

^b University of California   (United States)

Author keywords

Etching; Low index single crystal surfaces; Oxidation; Scanning tunneling microscopy; Silicon; Water

Indexed keywords

ADSORPTION; ATOMS; COALESCENCE; CRYSTAL ORIENTATION; ETCHING; OXIDATION; SCANNING TUNNELING MICROSCOPY; SINGLE CRYSTALS; SUBSTRATES; TEMPERATURE PROGRAMMED DESORPTION; WATER;

LOW INDEX SINGLE CRYSTAL SURFACES;

SILICON;

EID: 0031140172     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(97)00035-6     Document Type: Article

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