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Volumn 12, Issue 2, 1997, Pages 573-578

An improved reliability model for redundant protective systems - Markov models

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC EQUIPMENT PROTECTION; ELECTRIC POWER TRANSMISSION; MARKOV PROCESSES; MATHEMATICAL MODELS;

EID: 0031139926     PISSN: 08858950     EISSN: None     Source Type: Journal    
DOI: 10.1109/59.589606     Document Type: Article
Times cited : (95)

References (9)
  • 1
    • 0016114381 scopus 로고    scopus 로고
    • 'Optimum active-inactive protective times in supervised protective systems for nuclear reactors'
    • Vol. 55, 1974, pp. 219-224.
    • J.M. Kontoleon, N. Kontoleon and N.G. Chrysochoides, 'Optimum active-inactive protective times in supervised protective systems for nuclear reactors', Nuclear Science and Engineering, Vol. 55, 1974, pp. 219-224.
    • Nuclear Science and Engineering
    • Kontoleon, J.M.1    Kontoleon, N.2    Chrysochoides, N.G.3
  • 2
    • 0016540159 scopus 로고    scopus 로고
    • 'Determination of test intervals in certain repairable standby protective systems'
    • Vol. R-24, No. 3, August 1975. pp. 201-205.
    • S.C. Chay and M. Mazumdar, 'Determination of test intervals in certain repairable standby protective systems'. IEEE Transactions of Reliability, Vol. R-24, No. 3, August 1975. pp. 201-205.
    • IEEE Transactions of Reliability
    • Chay, S.C.1    Mazumdar, M.2
  • 3
    • 0019024137 scopus 로고    scopus 로고
    • 'Optimization of staggered inspection schedules for protective systems'
    • Vol. R-29, No. 2, June 1980, pp. 170-173.
    • T. Inagaki, K. Inoue and H. Akashi, 'Optimization of staggered inspection schedules for protective systems', IEEE Transactions of Reliability, Vol. R-29, No. 2, June 1980, pp. 170-173.
    • IEEE Transactions of Reliability
    • Inagaki, T.1    Inoue, K.2    Akashi, H.3
  • 4
    • 0021581098 scopus 로고    scopus 로고
    • 'Reliability evaluation of protective system with scheduled and unscheduled maintenance1
    • Vol. 24, 1984, pp. 957-960.
    • T. Kohda, K. Akinari, H. Kumamoto and K. Inoue, 'Reliability evaluation of protective system with scheduled and unscheduled maintenance1, Microelectronic Reliability, Vol. 24, 1984, pp. 957-960.
    • Microelectronic Reliability
    • Kohda, T.1    Akinari, K.2    Kumamoto, H.3    Inoue, K.4
  • 5
    • 0019069299 scopus 로고    scopus 로고
    • 'Protection system reliability modeling: Unreadiness probability and mean duration of undetected fault'
    • Vol. R- 29, No. 4, October 1980, pp. 339340.
    • C. Singh and A.D. Patton, 'Protection system reliability modeling: Unreadiness probability and mean duration of undetected fault', IEEE Transactions of Reliability, Vol. R-29, No. 4, October 1980, pp. 339340.
    • IEEE Transactions of Reliability
    • Singh, C.1    Patton, A.D.2
  • 6
    • 0026923654 scopus 로고    scopus 로고
    • 'An improved model for protectivesystem reliability'
    • Vol. R- 41, No. 3, September 1992, pp. 422-426.
    • P.M. Anderson and S.K. Agarwal, 'An improved model for protectivesystem reliability', IEEE Transactions of Reliability, Vol. R-41, No. 3, September 1992, pp. 422-426.
    • IEEE Transactions of Reliability
    • Anderson, P.M.1    Agarwal, S.K.2
  • 7
    • 0029289687 scopus 로고    scopus 로고
    • 'Predicting the optimum routine test interval for protective relays'
    • Paper 94 SM 426-7 PWRD, San Francisco, CA, July 24-28, 1994.
    • J.J. Kumm, M.S. Weber, D. Hou, E.O. Schweitzer, III, 'Predicting the optimum routine test interval for protective relays', Paper 94 SM 426-7 PWRD, Presented at the 1994 IEEE Summer Meeting, San Francisco, CA, July 24-28, 1994.
    • 1994 IEEE Summer Meeting
    • Kumm, J.J.1    Weber, M.S.2    Hou, D.3    Schweitzer III, E.O.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.