-
1
-
-
0016114381
-
'Optimum active-inactive protective times in supervised protective systems for nuclear reactors'
-
Vol. 55, 1974, pp. 219-224.
-
J.M. Kontoleon, N. Kontoleon and N.G. Chrysochoides, 'Optimum active-inactive protective times in supervised protective systems for nuclear reactors', Nuclear Science and Engineering, Vol. 55, 1974, pp. 219-224.
-
Nuclear Science and Engineering
-
-
Kontoleon, J.M.1
Kontoleon, N.2
Chrysochoides, N.G.3
-
2
-
-
0016540159
-
'Determination of test intervals in certain repairable standby protective systems'
-
Vol. R-24, No. 3, August 1975. pp. 201-205.
-
S.C. Chay and M. Mazumdar, 'Determination of test intervals in certain repairable standby protective systems'. IEEE Transactions of Reliability, Vol. R-24, No. 3, August 1975. pp. 201-205.
-
IEEE Transactions of Reliability
-
-
Chay, S.C.1
Mazumdar, M.2
-
3
-
-
0019024137
-
'Optimization of staggered inspection schedules for protective systems'
-
Vol. R-29, No. 2, June 1980, pp. 170-173.
-
T. Inagaki, K. Inoue and H. Akashi, 'Optimization of staggered inspection schedules for protective systems', IEEE Transactions of Reliability, Vol. R-29, No. 2, June 1980, pp. 170-173.
-
IEEE Transactions of Reliability
-
-
Inagaki, T.1
Inoue, K.2
Akashi, H.3
-
4
-
-
0021581098
-
'Reliability evaluation of protective system with scheduled and unscheduled maintenance1
-
Vol. 24, 1984, pp. 957-960.
-
T. Kohda, K. Akinari, H. Kumamoto and K. Inoue, 'Reliability evaluation of protective system with scheduled and unscheduled maintenance1, Microelectronic Reliability, Vol. 24, 1984, pp. 957-960.
-
Microelectronic Reliability
-
-
Kohda, T.1
Akinari, K.2
Kumamoto, H.3
Inoue, K.4
-
5
-
-
0019069299
-
'Protection system reliability modeling: Unreadiness probability and mean duration of undetected fault'
-
Vol. R- 29, No. 4, October 1980, pp. 339340.
-
C. Singh and A.D. Patton, 'Protection system reliability modeling: Unreadiness probability and mean duration of undetected fault', IEEE Transactions of Reliability, Vol. R-29, No. 4, October 1980, pp. 339340.
-
IEEE Transactions of Reliability
-
-
Singh, C.1
Patton, A.D.2
-
6
-
-
0026923654
-
'An improved model for protectivesystem reliability'
-
Vol. R- 41, No. 3, September 1992, pp. 422-426.
-
P.M. Anderson and S.K. Agarwal, 'An improved model for protectivesystem reliability', IEEE Transactions of Reliability, Vol. R-41, No. 3, September 1992, pp. 422-426.
-
IEEE Transactions of Reliability
-
-
Anderson, P.M.1
Agarwal, S.K.2
-
7
-
-
0029289687
-
'Predicting the optimum routine test interval for protective relays'
-
Paper 94 SM 426-7 PWRD, San Francisco, CA, July 24-28, 1994.
-
J.J. Kumm, M.S. Weber, D. Hou, E.O. Schweitzer, III, 'Predicting the optimum routine test interval for protective relays', Paper 94 SM 426-7 PWRD, Presented at the 1994 IEEE Summer Meeting, San Francisco, CA, July 24-28, 1994.
-
1994 IEEE Summer Meeting
-
-
Kumm, J.J.1
Weber, M.S.2
Hou, D.3
Schweitzer III, E.O.4
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