Determination of Test Intervals in Certain Repairable Standby Protective Systems

IEEE Transactions on Reliability

Volumn R-24, Issue 3, 1975, Pages 201-205

  Chay, S C ^a   Mazumdar, M ^a  

^a Westinghouse Research & Development Cent   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

NUCLEAR REACTORS;

EID: 0016540159     PISSN: 00189529     EISSN: 15581721     Source Type: Journal    
DOI: 10.1109/TR.1975.5215152     Document Type: Article

References (5)

1. S.C. Chay, W.D. Loftus, M. Mazumdar, “A Probabilistic Approach to Safety Testing and Maintenance.” Transactions of ASME, Journal of Engineering for Power, Vol. 96, July 1974, pp. 175-180.
2. D.W. Jorgenson, J.J. McCall, R. Radner, Optimal Replacement Policy, Rand McNally & Co., Chicago, Ill. (1967).
3. H.J. Otway, R.C. Erdmann, “Reactor siting and design from a risk viewpoint”, Nuclear Engineering and Design, Vol. 13, August 1970, pp. 365-376.
4. M. Shooman, Probabilistic Reliability: An Engineering Approach, McGraw-Hill (1968).
5. S.C. Chay, M. Mazumdar, “Supplement to this paper.” NAPS Document #02586-A. Order from: ASIS-NAPS, co Microfiche Publications/440 Park Avenue South/New York, New York 10016 USA. The order should state: “NAPS Document #02586, microfiche; $1.50 enclosed; send to_____V or ”NAPS Document #02586, full-size photocopy; $5.00 enclosed; send to_____”. Replace the_____ with the exact format of your address. Make all remittances payable to Microfiche Publications; you must prepay the entire amount. Price includes first-class postage only to North America; other countries add $0.50 for microfiche or $2.00 for full-size photocopy for postage (airmail) and handling. S.C. Chay//Mathematics Department//Westinghouse Research Laboratories//Pittsburgh, PA 15235 USA M. Mazumdar//Mathematics Department//Westinghouse Research Laboratories//Pittsburgh, PA 15235 USA