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Physical Review B - Condensed Matter and Materials Physics

Volumn 53, Issue 14, 1996, Pages 9353-9358

Far-infrared-axis response oC determined by ellipsometry

(4) Henn, R a Kircher, J a Cardona, M a Wittlin, A b

a MAX PLANCK INSTITUT FÜR FESTKÖRPERFORSCHUNG (Germany)

b RADBOUD UNIVERSITY NIJMEGEN (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0043264536 PISSN: 10980121 EISSN: 1550235X Source Type: Journal
DOI: 10.1103/PhysRevB.53.9353 Document Type: Article

Times cited : (11)

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