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Volumn 41, Issue 4, 1997, Pages 547-551
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Normal and anomalous behaviour of the RTS noise amplitude in forward biased InGaAs/InP photodiodes
a,b c |
Author keywords
[No Author keywords available]
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Indexed keywords
DIODES;
PHOTODETECTORS;
SEMICONDUCTING GALLIUM ARSENIDE;
SEMICONDUCTING INDIUM PHOSPHIDE;
SPURIOUS SIGNAL NOISE;
MULTICARRIER AUGER RECOMBINATION PROCESSES;
RANDOM TELEGRAPH SIGNAL (RTS) NOISE;
SHOCKLEY HALL READ (SHR) PROCESSES;
PHOTODIODES;
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EID: 0031122986
PISSN: 00381101
EISSN: None
Source Type: Journal
DOI: 10.1016/S0038-1101(96)00221-3 Document Type: Article |
Times cited : (3)
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References (21)
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