Fractured polymer/silica fiber surface studied by tapping mode atomic force microscopy

Surface Science

Volumn 290, Issue 1-2, 1993, Pages

  Zhong, Q ^a   Inniss, D ^a   Kjoller, K ^b   Elings, V B ^b  

^a LUCENT TECHNOLOGIES   (United States)

^b Digital Instruments   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DEGRADATION; FRACTURE; MICROSCOPIC EXAMINATION; OPTICAL FIBERS; SURFACES;

ATOMIC FORCE MICROSCOPY; POLYMER/SILICA INTERFACES;

FIBER REINFORCED PLASTICS;

EID: 0027610690     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/0039-6028(93)90582-5     Document Type: Article

References (9)

1. Atomic Force Microscopy