Theoretical calculation of core level shifts for O/Si(111) surfaces

Surface Science

Volumn 351, Issue 1-3, 1996, Pages 53-63

  Kageshima, Hiroyuki ^a   Tabe, Michiharu ^a,b  

^a NTT CORPORATION   (Japan)

^b SHIZUOKA UNIVERSITY   (Japan)

Author keywords

Density functional calculations; Oxidation; Silicon; Surface electronic phenomena

Indexed keywords

CHEMICAL BONDS; ELECTRON ENERGY LEVELS; EMISSION SPECTROSCOPY; MATHEMATICAL MODELS; OXIDATION; OXYGEN; SURFACE PHENOMENA; SURFACES; X RAY SPECTROSCOPY;

CORE LEVEL SHIFTS; DENSITY FUNCTIONAL CALCULATIONS; SURFACE ELECTRONIC PHENOMENA;

SEMICONDUCTING SILICON;

EID: 0030146236     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/0039-6028(95)01271-0     Document Type: Article

References (24)

1. S.I. Raider and R. Flitsch, J. Electrochem. Soc. 11 (1976) 1755.
2. C.M. Garner, I. Lindau, C.Y. Su, P. Pianetta and W.E. Spicer, Phys. Rev. B 19 (1979) 3944.
3. F.J. Grunthaner, P.J. Grunthaner, R.P. Vasquez, B.F. Lewis and J. Maserjian, J. Vac. Sci. Technol. 16 (1979) 1443.
4. F.J. Himpsel, F.R. Mcfeely, A. Taleb-Ibrahimi, J.A. Yarmoff and G. Hollinger, Phys. Rev. B 38 (1988) 6084.
5. M. Tabe, T.T. Chiang, I. Lindau and W.E. Spicer, Phys. Rev. B 34 (1986) 2706.
6. U. Höfer, P. Morgen, W. Wurth and E. Umbach, Phys. Rev. B 40 (1989) 1130.
7. F.J. Himpsel, P. Heinmann, T.-C. Chiang and D.E. Eastman, Phys. Rev. Lett. 45 (1980) 1112.
8. G. Hollinger, J.F. Moror, F.J. Himpsel, G. Hughes and J.L. Jordan, Surf. Sci. 168 (1986) 609.
9. A. Namiki, K. Tanimoto, T. Nakamura, N. Ohtake and T. Suzuki, Surf. Sci. 222 (1989) 530.
10. K. Prabhakaran, Y. Kobayashi and T. Ogino, Surf. Sci. 290 (1993) 239.
11. A. Redondo, W.A. Goddard III, C.A. Swarts and T.C. McGill, J. Vac. Sci. Technol. 19 (1981) 498.
12. Y. Miyamoto and A. Oshiyama, Phys. Rev. B 44 (1991) 5931.
13. A. Pasquarello, M.S. Hybertsen and R. Car, Phys. Rev. Lett. 74 (1995) 1024.
14. H. Kageshima and M. Tabe, in: Control of Semiconductor Interfaces, Eds. I. Ohdomari, M. Oshima and A. Hiraki (Elsevier Science, New York, 1994) p. 227.
15. K. Takayanagi, Y. Tanishiro, M. Takahashi and S. Takahashi, Surf. Sci. 164 (1985) 364.
16. A. Zunger and A.J. Freeman, Phys. Rev. B 15 (1977) 4716.
17. N. Shima, J. Phys. Soc. Jpn. 52 (1983) 578.
18. H. Kageshima and M. Tsukada, Phys. Rev. B 46 (1992) 6928.
19. D.M. Ceperley and B.J. Alder, Phys. Rev. Lett. 45 (1980) 566. J.P. Perdew and A. Zunger, Phys. Rev. B 23 (1981) 5048.
20. D.M. Ceperley and B.J. Alder, Phys. Rev. Lett. 45 (1980) 566. J.P. Perdew and A. Zunger, Phys. Rev. B 23 (1981) 5048.
21. E.P. Wigner, Phys. Rev. 46 (1938) 1002.
22. Y. Miyamoto and A. Oshiyama, Phys. Rev. B 41 (1990) 12680.
23. R.S. Mulliken, J. Chem. Phys. 23 (1955) 1833, 1841, 2338, 2343.
24. See, for example, M. Cardona and L. Ley, in: Photoemission in Solids I, Eds. M. Cardona and L. Ley (Springer, Berlin, 1978) p. 60, and references cited therein.