Assessment of convergence effects in weak-beam transmission electron microscopy in partial spacing measurements in Ni3Al

Philosophical Magazine Letters

Volumn 75, Issue 4, 1997, Pages 179-186

  Meng, X ^a   Schaublin R E ^a,b   Stobbs, W M ^a  

^a UNIVERSITY OF CAMBRIDGE   (United Kingdom)

^b EPFL   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

DISLOCATIONS (CRYSTALS); NICKEL COMPOUNDS; STACKING FAULTS;

PARTIAL SPACING MEASUREMENTS; WEAK BEAM TRANSMISSION ELECTRON MICROSCOPY (WB TEM);

TRANSMISSION ELECTRON MICROSCOPY;

EID: 0031119093     PISSN: 09500839     EISSN: 13623036     Source Type: Journal    
DOI: 10.1080/095008397179606     Document Type: Article

References (11)

1. Baluc, N., Karnthaler, H. P., and Mills, M. J., 1991, Phil. Mag. A, 64, 137.
2. Chen, C. Y., and Stobbs, W. M., 1996, J. Microsc., 181, 36.
3. Cockayne, D. J. H., Ray, I. L. F., and Whelan, M. J., 1969, Phil. Mag., 20, 1265.
4. Hemker, K. J., and Mills, M. J., 1993, Phil. Mag. A, 68, 305.
5. Hirsch, P. B., Howie, A., Nicholson, R. B., Pashley, D. W., and Whelan, M. J., 1965, Electron Microscopy of Thin Crystals (London: Butterworths), p. 229.
6. Schäublin, R. E., Meng, X., and Stobbs, W. M., 1995, EMAG95, Inst. Phys. Conf. Ser. No. 147 (Bristol: Institute of Physics), p. 91.
7. Schäublin, R. E., Meng, X., and Stobbs, W. M., 1996 Ultramicroscopy (submitted).
8. Schäublin, R., and Stadelmann, P., 1993, Mater. Sci. Engng. A, 164, 373.
9. Stobbs, W. M., and Sworn, C. H., 1971, Phil. Mag., 24, 1365.
10. Stroh, A. N., 1958, Phil. Mag., 3, 625.
11. VeyssiEre, P., and Noebe, R., 1992, Phil. Mag. A, 65, 13.