Beam convergence effects in the weak-beam imaging of inclined planar defects

Journal of Microscopy

Volumn 181, Issue 1, 1996, Pages 36-44

  Chen, C Y ^a   Stobbs, W M ^b  

^a INSTITUTE OF NUCLEAR ENERGY RESEARCH   (Taiwan)

^b Department of Materials Science and Metallurgy ^*  (United Kingdom)

Author keywords

Beam convergence; Stacking faults; Thin twins; Weak beam imaging; Fringes

Indexed keywords

BEAM CONVERGENCE; BEAM IMAGING; FRINGE CONTRASTS; PLANAR DEFECT; THIN TWIN; TWO BEAMS; WEAK BEAMS; WEAK-BEAM IMAGING; WEAK-BEAM TECHNIQUE; Α-FRINGE;

STACKING FAULTS;

ARTICLE; ELECTRON MICROSCOPY; PRIORITY JOURNAL;

EID: 0030048678     PISSN: 00222720     EISSN: None     Source Type: Journal    
DOI: 10.1046/j.1365-2818.1996.31368.x     Document Type: Article

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