Quasi-confinement, localization and optical properties in porous silicon

Thin Solid Films

Volumn 297, Issue 1-2, 1997, Pages 261-264

  Cruz, M ^a   Beltran M R ^a   Wang, C ^a   Taguena Martinez J ^a  

^a INSTITUTO DE INVESTIGACIONES EN MATERIALES   (Mexico)

Author keywords

Localization; Optical properties; Porous silicon; Quasi confinement

Indexed keywords

ATOMS; BAND STRUCTURE; HYDROGEN; LIGHT ABSORPTION; MATHEMATICAL MODELS; OPTICAL PROPERTIES; OSCILLATORS (ELECTRONIC); PASSIVATION; POROSITY;

INVERSE PARTICIPATION ENERGY; LOCALIZATION; QUASI CONFINEMENT;

POROUS SILICON;

EID: 0031118649     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(96)09370-4     Document Type: Article

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