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Volumn 160, Issue 2, 1997, Pages 567-574
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Trace analysis of selected high-purity metals using high-resolution inductively coupled plasma mass spectrometry and inductively coupled plasma optical emission spectrometry
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Author keywords
[No Author keywords available]
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Indexed keywords
COMPOSITION;
MASS SPECTROMETRY;
METALS;
PLASMA APPLICATIONS;
TRACE ELEMENTS;
HIGH RESOLUTION INDUCTIVELY COUPLED PLASMA MASS SPECTROMETRY;
INDUCTIVELY COUPLED PLASMA FLAMES;
INDUCTIVELY COUPLED PLASMA OPTICAL EMISSION SPECTROMETRY;
TRACE ANALYSIS;
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EID: 0031117291
PISSN: 00318965
EISSN: None
Source Type: Journal
DOI: 10.1002/1521-396X(199704)160:2<567::AID-PSSA567>3.0.CO;2-8 Document Type: Article |
Times cited : (11)
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References (11)
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