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Volumn 160, Issue 2, 1997, Pages 567-574

Trace analysis of selected high-purity metals using high-resolution inductively coupled plasma mass spectrometry and inductively coupled plasma optical emission spectrometry

Author keywords

[No Author keywords available]

Indexed keywords

COMPOSITION; MASS SPECTROMETRY; METALS; PLASMA APPLICATIONS; TRACE ELEMENTS;

EID: 0031117291     PISSN: 00318965     EISSN: None     Source Type: Journal    
DOI: 10.1002/1521-396X(199704)160:2<567::AID-PSSA567>3.0.CO;2-8     Document Type: Article
Times cited : (11)

References (11)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.