Roughness measurement by electronic speckle correlation and mechanical profilometry

Measurement: Journal of the International Measurement Confederation

Volumn 20, Issue 4, 1997, Pages 243-249

  Schirripa Spagnolo, Guiseppe ^a   Paoletti, Domenica ^a   Paoletti, Alfonso ^a   Ambrosini, Dario ^a  

^a UNIVERSITY OF L'AQUILA   (Italy)

Author keywords

In process measurement; Roughness measurements; Sensor system; Speckle

Indexed keywords

DIGITAL DEVICES; MECHANICAL ENGINEERING; OPTICAL CORRELATION; OPTICAL SENSORS; OPTICAL SYSTEMS; OPTICAL VARIABLES MEASUREMENT; RANDOM PROCESSES; SPECKLE;

DIGITAL SPECKLE CORRELATION; MEASURING PRINCIPLE; MECHANICAL PROFILOMETRY; STYLUS;

ROUGHNESS MEASUREMENT;

EID: 0031108426     PISSN: 02632241     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0263-2241(97)00036-5     Document Type: Article

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