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Volumn 132, Issue 1-2, 1996, Pages 24-28

Digital speckle correlation for on-line real-time measurement

Author keywords

[No Author keywords available]

Indexed keywords

DIGITAL SIGNAL PROCESSING; OPTICAL SYSTEMS; RANDOM PROCESSES; REAL TIME SYSTEMS; SPECKLE; SURFACE MEASUREMENT;

EID: 0030288549     PISSN: 00304018     EISSN: None     Source Type: Journal    
DOI: 10.1016/0030-4018(96)00308-2     Document Type: Article
Times cited : (17)

References (18)
  • 2
    • 0042216787 scopus 로고
    • Stanford Electronics Laboratories, Stanford CA
    • J.W. Goodman, Tech. Rep. no. 2303-1 (Stanford Electronics Laboratories, Stanford CA, 1963).
    • (1963) Tech. Rep. No. 2303-1
    • Goodman, J.W.1
  • 9
    • 0002039198 scopus 로고
    • Surface roughness measurement
    • Ed. K. Erf Academic Press, New York
    • T. Asakura, Surface roughness measurement, in: Speckle Metrology, Ed. K. Erf (Academic Press, New York, 1978).
    • (1978) Speckle Metrology
    • Asakura, T.1
  • 12
    • 0000211743 scopus 로고
    • Photomechanics and Speckle metrology
    • B. Ruffing and J. Auschütz, in: Photomechanics and Speckle Metrology, Proc. SPIE 814 (1987) p. 105.
    • (1987) Proc. SPIE , vol.814 , pp. 105
    • Ruffing, B.1    Auschütz, J.2
  • 17
    • 0042216783 scopus 로고
    • American Society of Mechanical Engineers, New York
    • ANSI/ASME B46.1 Surface Texture (American Society of Mechanical Engineers, New York, 1985).
    • (1985) ANSI/ASME B46.1 Surface Texture
  • 18
    • 0002068881 scopus 로고
    • Statistical properties of laser speckle patterns
    • Ed. J.C. Dainty Springer, Berlin
    • J.W. Goodman, Statistical properties of laser speckle patterns, in: Laser Speckle and Related Phenomena, Ed. J.C. Dainty (Springer, Berlin, 1975).
    • (1975) Laser Speckle and Related Phenomena
    • Goodman, J.W.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.