Laterally resolved measurements of polycrystalline cesium iodide surfaces

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 387, Issue 1-2, 1997, Pages 163-170

  Rudolf, Petra ^a   Marchal, F ^a   Sporken, R ^a   Caudano, R ^a   Dell'Orto, Tiziana ^b   Almeida, J ^c   Braem, A ^d   Piuz, F ^d   Sgobba, S ^d   Paic, G ^e   Nappi, E ^f   Valentini, A ^f   Sartori, P ^g   Coluzza, C ^h  

^a UNIVERSITY OF NAMUR   (Belgium)

^b Ctro Competenza per M   (Italy)

^c EPFL   (Switzerland)

^d CERN   (Switzerland)

^e SUBATECH   (France)

^f INFN SEZIONE DI BARI   (Italy)

^g SEZIONE DI PADOVA   (Italy)

^h INFN SEZIONE DI ROMA   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL ANALYSIS; COMPOSITION EFFECTS; ELECTRON EMISSION; ELECTRON SPECTROSCOPY; MORPHOLOGY; PHOTOCATHODES; POLYCRYSTALLINE MATERIALS; QUANTUM EFFICIENCY; STOICHIOMETRY; SURFACE STRUCTURE; SYNCHROTRON RADIATION; X RAYS;

CESIUM IODIDE; ELECTRON SPECTROSCOPY FOR CHEMICAL ANALYSIS (ESCA); SCANNING AUGER MICROPROBE (SAM);

CESIUM COMPOUNDS;

EID: 0031102715     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-9002(96)00981-3     Document Type: Article

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