Optimization of k-space sampling in atomic imaging by electron emission holography

Surface Science

Volumn 365, Issue 2, 1996, Pages 535-546

  Len, P M ^a   Thevuthasan, S ^a,b,c   Kaduwela, A P ^a,b   Van Hove, M A ^b   Fadley, C S ^a,b  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^c PACIFIC NORTHWEST NATIONAL LABORATORY   (United States)

Author keywords

Angle resolved photoemission; Copper; Electron solid interactions, scattering, diffraction; Photoelectron diffraction; Photoelectron holography; Semi empirical models and model calculations; Single crystal surfaces

Indexed keywords

ALGORITHMS; ATOMS; CALCULATIONS; CARRIER CONCENTRATION; CONTINUUM MECHANICS; ELECTRON DIFFRACTION; ELECTRON EMISSION; ELECTRON SCATTERING; FOURIER TRANSFORMS; IMAGE QUALITY; MATHEMATICAL MODELS; OPTIMIZATION;

ATOMIC IMAGING; ELECTRON SOLID DIFFRACTION; ELECTRON SOLID INTERACTIONS; ELECTRON SOLID SCATTERING; PHOTOELECTRON DIFFRACTION; PHOTOELECTRON HOLOGRAPHY; SEMI EMPIRICAL MODELS; SINGLE CRYSTAL SURFACES;

HOLOGRAPHY;

EID: 0030244247     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/0039-6028(96)00719-4     Document Type: Article

References (41)

1. (a) D.H. Rosenblatt, J.G. Tobin, M.G. Mason, R.F. Davis, S.D. Kevan, D.A. Shirley, C.H. Li and S.Y. Tong, Phys. Rev. B 23 (1981) 3828.
2. (b) P.J. Orders and C.S. Fadley, Phys. Rev. B 27 (1983) 781, and references therein.
3. A. Szöke, in: Short Wavelength Coherent Radiation: Generation and Applications, AIP Conf. Proc. No. 147, Eds. D.T. Atwood and J. Boker (AIP, New York, 1986).
4. J.J. Barton, Phys. Rev. Lett. 61 (1988) 1356.
5. (a) G.R. Harp, D.K. Saldin and B.P. Tonner, Phys. Rev. B 42 (1990) 9199.
6. (b) S. Thevuthasan, R.X. Ynzunza, E.D. Tober, C.S. Fadley, A.P. Kaduwela and M.A. Van Hove, Phys. Rev. Lett. 70 (1993) 595, and references therein.
7. J.J. Barton, Phys. Rev. Lett. 67 (1991) 3106.
8. S.Y. Tong, H. Huang and C.M. Wei, Phys. Rev. B 46 (1992) 2452.
9. (a) L.J. Terminello, J.J. Barton and D.A. Lapiano-Smith, J. Vac. Sci. Technol. B 10 (1992) 2088; Phys. Rev. Lett. 70 (1993) 599.
10. (a) L.J. Terminello, J.J. Barton and D.A. Lapiano-Smith, J. Vac. Sci. Technol. B 10 (1992) 2088; Phys. Rev. Lett. 70 (1993) 599.
11. (b) B.L. Petersen, L.J. Terminello, J.J. Barton and D.A. Shirley, Chem. Phys. Lett. 220 (1994) 46.
12. (c) B.L. Petersen, PhD Thesis University of California-Berkeley, 1995.
13. (a) J.G. Tobin, G.D. Waddill, H. Li and S.Y. Tong, Phys. Rev. Lett. 70 (1993) 4150.
14. (b) H. Wu, G.J. Lapeyre, H. Huang and S.Y. Tong, Phys. Rev. Lett. 71 (1993) 251.
15. (a) S.Y. Tong, H. Li and H. Huang, Phys. Rev. B 51 (1995) 1850.
16. (b) H. Wu and G.J. Lapeyre, Phys. Rev. B 51 (1995) 14549.
17. (a) H. Li, S.Y. Tong, D. Naumovic, A. Stuck and J. Osterwalder, Phys. Rev. B 47 (1993) 10036.
18. (b) D.K. Saldin, G.R. Harp and X. Chen, Phys. Rev. B 48 (1993) 8234.
19. (a) Z.-L. Han, S. Hardcastle, G.R. Harp, H. Li, X.-D. Wang, J. Zhang and B.P. Tonner, Surf. Sci. 258 (1991) 313 and references therein.
20. (b) I.H. Hong, P.R. Jeng, S.C. Shyu, Y.C. Chou and C.M. Wei, Surf. Sci. 312 (1994) 743.
21. (a) M.A. Mendez, C. Glück, J. Guerrero, P.L. de Andres, K. Heinz, D.K. Saldin and J.B. Pendry, Phys. Rev. B 45 (1992) 9402, and references therein.
22. (b) C.M. Wei, S.Y. Tong, H. Wedler, M.A. Mendez and K. Heinz, Phys. Rev. Lett. 72 (1994) 2434, and references therein.
23. (c) D.K. Saldin and X. Chen, Phys. Rev. B 52 (1995) 2941, and references therein.
24. B.P. Tonner, Z.-L. Han, G.R. Harp and D.K. Saldin, Phys. Rev. B 43 (1991) 14423.
25. (a) S. Thevuthasan, G.S. Herman, A.P. Kaduwela, T.T. Tran, Y.J. Kim, R.S. Saiki, C.S. Fadley and MA Van Hove, J. Vac. Sci. Technol. A 10 (1992) 2261.
26. (b) P. Hu and D.A. King, Phys. Rev. B 46 (1992) 13615.
27. (a) M. Tegze and G. Faigel, Europhys. Lett. 16 (1991) 41.
28. (b) P.M. Len, S. Thevuthasan, C.S. Fadley, A.P. Kaduwela and M.A. Van Hove, Phys. Rev. B 50 (1994) 11275.
29. (c) T. Gog, P.M. Len, D. Bahr, C.S. Fadley, G. Materlik and C. Sanchez-Hanke, to be published.
30. (a) C.M. Wei, J.H. Hong, P.R. Jeng, S.C. Shyu and Y.C. Chou, Chem. Phys. Lett. 228 (1994) 513.
31. (b) L.J. Terminello, to be published.
32. (a) C.S. Fadley, in: Synchrotron Radiation Research: Advances in Surfaces and Interface Science, Ed. R.Z. Bachrach (Plenum, New York, 1992).
33. (b) D.J. Friedman and C.S. Fadley, J. Electron. Spectrosc. 51 (1990) 689.
34. A.P. Kaduwela, D.J. Friedman and C.S. Fadley, J. Electron Spectrosc. Relat. Phenom. 57 (1991) 223.
35. (a) P.M. Len, F. Zhang, S. Thevuthasan, A.P. Kaduwela, M.A. Van Hove and C.S. Fadley, J. Electron Spectrosc. Relat. Phenom. 76 (1995) 351.
36. (b) S. Thevuthasan, P.M. Len and C.S. Fadley, unpublished results.
37. D.K. Saldin, G.R. Harp and B.P. Tonner, Phys. Rev. B 45 (1992) 9629.
38. E.O. Brigham, The Fast Fourier Transform and its Applications (Prentice-Hall, New Jersey, 1988).
39. D.K. Saldin, G.R. Harp, B.L. Chen and B.P. Tonner, Phys. Rev. B 44 (1991) 2480; D.K. Saldin, G.R, Harp and B.P. Tonner, Phys. Rev. B 45 (1992) 9629, and references therein.
40. D.K. Saldin, G.R. Harp, B.L. Chen and B.P. Tonner, Phys. Rev. B 44 (1991) 2480; D.K. Saldin, G.R, Harp and B.P. Tonner, Phys. Rev. B 45 (1992) 9629, and references therein.
41. G.R. Harp, D.K. Saldin, X. Chen, Z.-L. Han and B.P. Tonner, J. Electron Spectrosc. Relat. Phenom. 70 (1991) 331.