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Volumn 44, Issue 2, 1997, Pages 380-385

A new focusing ultrasonic transducer and two foci acoustic lens for acoustic microscopy

Author keywords

[No Author keywords available]

Indexed keywords

ACOUSTIC MICROSCOPES; BANDWIDTH; DIELECTRIC FILMS; FOCUSING; IMAGE QUALITY; ULTRASONIC IMAGING; ULTRASONIC REFLECTION; VAPOR DEPOSITION;

EID: 0031095130     PISSN: 08853010     EISSN: None     Source Type: Journal    
DOI: 10.1109/58.585122     Document Type: Article
Times cited : (11)

References (13)
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    • C. F. Quate, A. Atalar, and H. K. Wickramasinghe, "Acoustic microscope with mechanical scanning-a review," IEEE Proc., vol. 67, pp. 1092-113, 1979
    • IEEE Proc.
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  • 2
    • 0019596786 scopus 로고    scopus 로고
    • Linearly focused acoustic beams for acoustic microscopy
    • vol. 17, no. 15, pp. 520-522, 1981
    • J. Kushibiki, A. Ohkubo and N. Chubachi, "Linearly focused acoustic beams for acoustic microscopy," Electronic Letters, vol. 17, no. 15, pp. 520-522, 1981
    • Electronic Letters
    • Kushibiki A Ohkubo, J.1    Chubachi, N.2
  • 3
    • 0018811342 scopus 로고    scopus 로고
    • Performance of scanning acoustic microscope employing concave transducer
    • 1979 Ultrasonic Symp. Proc., pp. 415-419, 1979
    • N. Chubachi, J. Kushibiki, T. Sannomiua, and Y. lyama, "Performance of scanning acoustic microscope employing concave transducer," IEEE 1979 Ultrasonic Symp. Proc., pp. 415-419, 1979
    • IEEE
    • Chubachi, N.1    Kushibiki, J.2    Sannomiua, T.3    Lyama, Y.4
  • 4
    • 33747940353 scopus 로고    scopus 로고
    • Ultrasonic transducer employing piezoelectric polymer material
    • 4,577,132, May 18, 1986
    • H. Ohigasi, K. Koga, and T. Nakanishi, "Ultrasonic transducer employing piezoelectric polymer material," U.S. patent No. 4,577,132, May 18, 1986
    • U.S. Patent No.
    • Ohigasi, H.1    Koga, K.2    Nakanishi, T.3
  • 8
    • 0008637724 scopus 로고    scopus 로고
    • Acoustic scanning microscope for investigation of subsurface defects, in
    • vol. 19, pp. 645-649, H. Ermert and H.-P. Harjes, Eds., New York: Plenum, 1992.
    • K. I. Maslov, "Acoustic scanning microscope for investigation of subsurface defects," in Acoustical Imaging, vol. 19, pp. 645-649, H. Ermert and H.-P. Harjes, Eds., New York: Plenum, 1992.
    • Acoustical Imaging
    • Maslov, K.I.1
  • 9
    • 0001758591 scopus 로고    scopus 로고
    • Theory of focusing radiators
    • vol. 21, pp. 516-526, 1949
    • H. T. O'Neyl, "Theory of focusing radiators," J. Acoust. Soc. Amer., vol. 21, pp. 516-526, 1949
    • J. Acoust. Soc. Amer.
    • O'Neyl, H.T.1
  • 10
    • 6144242805 scopus 로고    scopus 로고
    • The effect of the focal plane position on image of spherical object in the reflection acoustic microscope
    • vol. 16, pp. 84-88, 1992
    • O. V. Kolosov, O. I. Lobkis, K. I. Maslov, and P. V. Zinin, "The effect of the focal plane position on image of spherical object in the reflection acoustic microscope," Acoust. Lett., vol. 16, pp. 84-88, 1992
    • Acoust. Lett.
    • Kolosov, O.V.1    Lobkis, O.I.2    Maslov, K.I.3    Zinin, P.V.4
  • 11
    • 0018529739 scopus 로고    scopus 로고
    • Ray interpretation of material signature in the acoustic microscopy
    • vol. 15, pp. 684-686, 1978
    • W. Parmon and H. L. Bertony, "Ray interpretation of material signature in the acoustic microscopy," Electron. Lett., vol. 15, pp. 684-686, 1978
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    • Parmon, W.1    Bertony, H.L.2
  • 13
    • 0001642569 scopus 로고    scopus 로고
    • Direct measurements of the SAW velocity and attenuation using continuous wave reflection scanning acoustic microscope (SAMCRUW)
    • vol. 18, pp. 227-235, H. Lee and G. Wade, Eds., New York: Plenum, 1991.
    • A. Kulik, G. Gremaud, and S. Sathish, "Direct measurements of the SAW velocity and attenuation using continuous wave reflection scanning acoustic microscope (SAMCRUW)," in Acoustical Imaging, vol. 18, pp. 227-235, H. Lee and G. Wade, Eds., New York: Plenum, 1991.
    • In Acoustical Imaging
    • Kulik, A.1    Gremaud, G.2    Sathish, S.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.