Linearly focused acoustic beams for acoustic microscopy

Electronics Letters

Volumn 17, Issue 15, 1981, Pages 520-522

  Kushibiki, J ^a   Ohkubo, A ^a   Chubachi, N ^a  

^a TOHOKU UNIVERSITY   (Japan)

Author keywords

Acoustic microscopy; Acousto optics

Indexed keywords

MICROSCOPES - ACOUSTIC WAVE EFFECTS;

ACOUSTIC MICROSCOPY;

ACOUSTOOPTICAL DEVICES;

EID: 0019596786     PISSN: 00135194     EISSN: None     Source Type: Journal    
DOI: 10.1049/el:19810364     Document Type: Article

References (8)

1. Quate, C. F., Atalar, A., and Wickramasinghe, H. K.: ‘Acoustic microscopy with mechanical scanning—a review’, Proc. IEEE, 1979, 67, pp. 1092–1114
2. Atalar, A., Quate, C. F., and Wickramasinghe, H. K.: ‘Phase imaging in reflection with the acoustic microscope’, Appl. Phys. Lett., 1977, 31, pp. 791–793
3. Weglein, R. D.: ‘A model for predicting acoustic material signatures’, Appl. Phys. Lett., 1979, 34, pp. 179–181
4. Weglein, R. D.: ‘SAW dispersion and film-thickness measurement by acoustic microscopy’, Appl. Phys. Lett., 1979, 35, pp. 215–217
5. Weglein, R. D.: ‘Acoustic microscopy applied to SAW dispersion and film thickness measurement’, IEEE Trans., 1980, SU-27, pp. 82–86
6. Kushibiki, J., Maehara, H., and Chubachi, N.: ‘Acoustic properties of evaporated chalcogenide glass films’, Electron. Lett., 1981, 17, (9), pp. 322–323
7. Torikai, Y.: ‘Ultrasonic fields and Lommel's functions’. Report of Institute of Industrial Science, University of Tokyo, March 1976, 25
8. Kushibiki, J., Ohkubo, A., and Chubachi, N.: ‘Anisotropy detection in sapphire by acoustic microscope using line-focus beam’, submitted to Electron. Lett.